GX5295： PXI board with dynamic digital I/O including programmable logic levels and PMUs for each channel

• 32 input/output channels, dynamically configurable on each channel
• 4 programmable level control/timing channels
• 256MB onboard vector memory
• The driving/sensing voltage range for each channel is -2V to+7V, and each pin is a PMU
• 100 MHz test rate
• Incentive/Response and Real time Comparison Mode
• Suitable for semiconductor testing based on PXI

overview

The GX5295 features a compact 3U PXI form factor that provides excellent digital testing capabilities and channel density. Providing performance digital and analog testing capabilities, the GX5295 offers a cost-effective tester for each pin architecture, making it an ideal choice for high-throughput mixed signal component testing applications. Each digital channel can be individually programmed as a driver, driver, sensing signal, sensing current, and load value (with commutation voltage level). In addition, each channel provides a parameter measurement unit (PMU), providing users with the ability to perform parallel DC measurements on the DUT (device under test).

GX5295 supports deep mode memory, provides 256 MB of onboard vector memory, dynamically controls the direction of each pin, and has a testing speed of up to 100 MHz. This board supports incentive/response and real-time comparison operation modes, allowing users to maximize test throughput for uninterrupted testing of components and UUTs that require deep memory testing modes. Single board design supports master and slave functions without the need for additional modules.

The pin electronic resources of GX5295 are independent on a channel by channel basis and include a fully functional PMU for the DC characteristics of the DUT. PMU can execute forced voltage/test current or forced current test voltage modes. In addition, the driver and receiver can be configured to support differential input and output signals from/to the UUT. A window opening method is used for memory access, which limits the required PCI memory space of each board to only 16 MB, thereby preserving testing system resources. It also supports direct mode for testing continuous data transmission between the system controller and the I/O pins of GX5295.

GX5295 provides 256 MB of vector memory, with 64 Mb per channel. Programmable I/O width allows for the transaction vector width of vector depth. Under software control, the vector memory of GX5295 can be configured to support channel widths of 32, 16, 8, 4, 2, and 1, with corresponding vector depths of 64 Mb, 128 Mb, 256 Mb, 512 Mb, 1024 Mb, and 2048 Mb.

GX5295 provides programmable LVTTL output clock and gating, and supports external clock and strobe. Programmable PLL (Phase Locked Loop) provides configurable clock frequency and delay. In addition, four additional pin electronic resources can be used as timing and/or control resources - providing programmable driving and sensing levels from -2 to+7V.

The sequencer of GX5295 can stop or pause through an address or loop defined by the entire memory, or loop through a defined address range or memory block. It also supports two modes of digital testing - excitation/response and real-time comparison mode. The incentive/response mode is used to drive and capture data. Alternatively, for digital testing that requires long test vectors, real-time comparison mode can be used to significantly reduce overall testing time by comparing real-time, expected test results with only recorded fault vectors and synthesized test results (pass or fail).

software

GX5295 is provided with DIOEasy, which offers powerful graphic vector development/waveform display tools, as well as virtual dashboards, 32-bit DLL driver libraries, and documentation. Virtual panels can be used to interactively control and monitor instruments from a window that displays their current settings and status. In addition, various interface files can access the instrument's functional library for programming tools and languages such as ATEasy, C / C ++，Microsoft VisualBasic ®， Delphi and LabVIEW.

Optionally, DtifEasy can be used with GX5295. DtifEasy provides a complete LASAR post processor and test execution environment for post processing and executing LASAR generated. tap files.

application

• Automatic Test Equipment (ATE)
• semiconductor testing
• Monitor, printer, and disk drive testing
• ASIC testing
• A/D and D/A testing
• Video capture/playback application
• High speed, bidirectional bus testing/simulation